Veröffentlichungen

Vehicle Intention Classification Using Visual Clues
Klemp, M.; Wagner, R.; Rosch, K.; Lauer, M.; Stiller, C.
2024. 2024 IEEE International Conference on Robotics and Automation (ICRA), Yokohama, 13th-17th May 2024, 16395 – 16401, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ICRA57147.2024.10610547

LDFA: Latent Diffusion Face Anonymization for Self-driving Applications
Klemp, M.; Rösch, K.; Wagner, R.; Quehl, J.; Lauer, M.
2023. Proceedings : 2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, Vancouver, Canada 18 – 22 June 2023, CVPRW. Ed.: IEEE, 3199–3205, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/CVPRW59228.2023.00322

Space, Time, and Interaction: A Taxonomy of Corner Cases in Trajectory Datasets for Automated Driving
Rösch, K.; Heidecker, F.; Truetsch, J.; Kowol, K.; Schicktanz, C.; Bieshaare, M.; Sick, B.; Stiller, C.
2023. 2022 IEEE Symposium Series on Computational Intelligence (SSCI), 86–93, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/SSCI51031.2022.10022241

Fast and Robust Ground Surface Estimation from LiDAR Measurements using Uniform B-Splines
Wirges, S.; Rösch, K.; Bieder, F.; Stiller, C.
2021. 2021 IEEE 24th International Conference on Information Fusion (FUSION). Hrsg.: IEEE, Institute of Electrical and Electronics Engineers (IEEE)

Towards Sensor Data Abstraction of Autonomous Vehicle Perception Systems
Reichert, H.; Lang, L.; Rösch, K.; Bogdoll, D.; Doll, K.; Sick, B.; Rellss, H.-C.; Stiller, C.; Zöllner, J. M.
2021. 2021 IEEE International Smart Cities Conference (ISC2). Ed.: IEEE, 1–4, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ISC253183.2021.9562912

An application-driven conceptualization of corner cases for perception in highly automated driving
Heidecker, F.; Breitenstein, J.; Rosch, K.; Lohdefink, J.; Bieshaar, M.; Stiller, C.; Fingscheidt, T.; Sick, B.
2021. 2021 IEEE Intelligent Vehicles Symposium (IV): 11-17 July 2021, online, 644–651, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/IV48863.2021.9575933